Publication:
Optical characterization and bandgap engineering of flat and wrinkle-textured FA0.83Cs0.17Pb(I1-xBrx)3 perovskite thin films
Optical characterization and bandgap engineering of flat and wrinkle-textured FA0.83Cs0.17Pb(I1-xBrx)3 perovskite thin films
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Date
2018
Authors
Tejada A.
Braunger S.
Korte L.
Albrecht S.
Rech B.
Guerra J.A.
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Publisher
American Institute of Physics Inc.
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Abstract
The complex refractive indices of formamidinium cesium lead mixed-halide [FA0.83Cs0.17Pb(I1– xBrx)3] perovskite thin films of compositions ranging from x = 0 to 0.4, with both flat and wrinkle-textured surface topographies, are reported. The films are characterized using a combination of variable angle spectroscopic ellipsometry and spectral transmittance in the wavelength range of 190 nm to 850 nm.
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Keywords
Thin films,
Cesium compounds,
Energy gap,
Lead compounds,
Perovskite,
Perovskite solar cells,
Refractive index,
Spectroscopic ellipsometry,
Complex refractive index,
Global error function,
Laser confocal microscope,
Optical characterization